Materials Characterization is an integral aspect of the semiconductor research, development, production and returns analysis process. There are many dozens of materials characterization techniques used on semiconductor and electronic components. In this course, we will cover some of the more commonly used techniques. This includes techniques such as:
- Auger Electron Spectroscopy (AES)
- Electron Energy Loss Spectroscopy (EELS)
- Energy Dispersive X-Ray Spectroscopy (EDS or EDX)
- Scanning Electron Microscopy (SEM)
- Scanning Transmission Electron Microscopy (STEM)
- Secondary Ion Mass Spectroscopy (SIMS)
- Transmission Electron Microscopy (TEM)
- X-Ray Diffraction (XRF)
- X-Ray Photoelectron Spectroscopy (XPS)
- and others.
Estimated Course Duration: 8