Electrical analysis is critical to the success of most failure analysis work. In order to diagnose a problem with an integrated circuit one must be able to first reproduce the electrical failure mode, and second develop a simplified electrical test that will enable analysis using various techniques. This workspace covers basic device operation, curve tracer use, automatic test equipment, and electrical characteristics associated with trapped charge and mobile ionic contamination. It also covers techniques for troubleshooting a variety of microelectronic circuits including digital logic, memories, microprocessors and microcontrollers, and analog circuits. Finally, this section covers tools that can be used to automate the process of troubleshooting.
